The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 1988

Filed:

Jul. 28, 1986
Applicant:
Inventor:

Brian A Childers, Santa Clara, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
3401462 ; 36471511 ;
Abstract

Method of detecting the INFO 1 signal pattern which avoids false activation of a data transmission line caused by noise on the line. An initial line sampling rate four times the nominal 192 kbs line rate is used to detect a HIGH mark to avoid the difficulties resulting from sampling right at the edge of a mark. Subsequent sampling is done at the nominal line rate to detect two opposite polarity marks out of every consecutive eight-bit time periods. If six consecutive eight-bit time periods are detected, each having its HIGH and LOW marks in the same relative positions, the line is activated. The method is readily implemented as a set of three 'state machines' and consequently can be constructed from programmable logic arrays.


Find Patent Forward Citations

Childers, Brian. (1988). Info 1 detection (U.S. Patent No. 4771264). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4771264

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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