The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 1988
Filed:
Jul. 07, 1986
Applicant:
Inventor:
Thomas P Weismuller, Orange, CA (US);
Assignee:
Rockwell International Corporation, El Segundo, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250308 ; 2503581 ;
Abstract
An apparatus and method for measuring the thickness of thin basal coatings on work pieces. The apparatus comprises a beta backscatter type measuring instrument including a work piece positioning system to permit the precise positioning of a coated work piece surface to radiation in a repeatable, non-destructive, non-contacting position with respect to the radiation source.
Quick Actions:
Weismuller, Thomas. (1988). Contactless apparatus and method for thickness determination of coatings (U.S. Patent No. 4771173). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4771173
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile