The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 1988

Filed:

May. 22, 1987
Applicant:
Inventors:

Michael Weber-Grabau, San Jose, CA (US);

Stephen C Bradshaw, Watsonville, CA (US);

John E Syka, Sunnyvale, CA (US);

Assignee:

Finnigan Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250282 ; 250283 ; 250290 ; 250291 ; 250292 ; 2502521 ;
Abstract

A method is disclosed for increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer operating in the chemical ionization mode. Prior to mass analysis, a prescan is performed with the ion trap and the ionization and reaction periods are adjusted to produce enough stored product or analyte ions to generate a good signal-to-noise ratio in the detection of trace amounts of analyte, yet not so many analyte ions that resolution in the mass spectrum is lost. A mass analysis scan is then performed with the ion trap using the ionization and reaction periods predetermined during the prescan.


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