The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 1988
Filed:
Apr. 23, 1986
Harold Van Aken, Callicoon Center, NY (US);
William L Weber, Walkill, NY (US);
Kollmorgen Corporation, Simsbury, CT (US);
Abstract
A spectrophotometer (10) is provided having the capability to accurately measure spectral reflectance at relatively long sample distances. A first illumination optics arrangement (14) assures uniform illumination to a portion of the sample and a second optical arrangement (20) focuses the reflected image of part of the illuminated sample onto a polychromator (22). Reference beam means are provided so that the polychromator sequentially measures the spectral characteristics of the reference beam and the sample. Continuous monitoring of the illumination at select wavelengths provides illumination normalization data so that a microprocessor (40) can normalize the illumination and compare the reference beam and sample measurements to accurately determine the spectral reflectance characteristics of the sample. Angular and raster scanning capability is also provided.