The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 1988

Filed:

Jan. 14, 1986
Applicant:
Inventor:

Kenji Yamada, Narashino, JP;

Assignee:

Nippon Kogaku K. K., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351212 ; 351211 ; 351247 ; 356376 ;
Abstract

Apparatus for measuring curvature of an object automatically is so composed to guide two radiation beams reflected by the object to a linear image sensor, and determine the curvature of the object from the signals obtained from the linear image sensor, in response to the distance of two radiation beams on the sensor. The apparatus is further provided with an image rotator between means for generating two radiation beams and the object.


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