The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 1988

Filed:

Aug. 26, 1986
Applicant:
Inventors:

Masakatsu Hiraoka, Uji, JP;

Kazushi Tsumura, Nagaokakyo, JP;

Kenji Baba, Hitachi, JP;

Shoji Watanabe, Hitachi, JP;

Mikio Yoda, Ibaraki, JP;

Naoki Hara, Hitachi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
364555 ; 210 85 ; 36441301 ;
Abstract

The image of microorganisms contained in a sludge of an aeration tank is picked up by an image pickup device having the function of magnifying and picking up microorganism images. Binarizing processing is then made to obtain a binarized image from the resulting gray image, and the binarized image is subjected to thinning processing. The number of pixels of the image left after often the thinning processing is counted to measure the amount of filamentous microorganisms. In this manner, the amount of the filamentous microorganisms can be measured accurately irrespective of their thickness.


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