The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 1988
Filed:
Jun. 16, 1986
Gerhard Trieb, Konigsbronn, DE;
Karl Schepperle, Oberkochen, DE;
Karl-Eugen Aubele, Gussenstadt, DE;
Carl-Zeiss-Stiftung, Heidenheim/Brenz, DE;
Abstract
A 'scanning' work-contact probe is deflectable with respect to a measuring-machine head which is driven by the three-coordinate drive system of the measuring machine. The arrangement is such that the probe continuously tracks (scans) a desired profile of a workpiece and, in doing so, measured probe increments (decrements) of deflection with respect to the head are so mathematically combined with head-position data that, in the further circumstance of holding path-velocity magnitude .vertline.V.sub.des. .vertline. of the measuring machine to a constant value, the orientation of the probe head with respect to the locally contacted slope of the workpiece can also be a constant.