The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 1988

Filed:

May. 23, 1986
Applicant:
Inventors:

Michel Torregrosa, Portes Les Valence, FR;

Eric Margaillan, Gap, FR;

Assignee:

Crouzet, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C / ;
U.S. Cl.
CPC ...
356-5 ; 342127 ; 342145 ;
Abstract

A method and device are provided for measuring the propagation time of a wave, wherein a wave is transmitted modulated in amplitude by a modulation signal. The wave reflected by an obstacle is received after a propagation time and the amplitude thereof is detected. The average value of the product of the detected signal and a reference signal is calculated and the delay with respect to the modulation signal is controlled so as to cancel out the average value. The modulation signal and the reference signal comprise a succession of elementary signals chosen so as to allow, in a single measurement, a long propagation time to be determined without ambiguity and with high accuracy.


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