The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 1988
Filed:
Jan. 21, 1986
Hitachi Construction Machinery Co., Ltd., Tokyo, JP;
Abstract
A supersonic flaw detecting system has a probe adapted to emit a supersonic wave towards an object to be inspected, a scanning device for causing a relative movement between the probe and the object in two orthogonal directions, a pulser-receiver adapted to supply pulses to the probe and receive the supersonic wave from the object and produce an electric signal indicative thereof, a signal processing device for converting the electric signal from the pulser-receiver into an image data signal for a C-scope display, an oscilloscope for conducting an A-scope display of the electric signal from the pulser-receiver, and a monitor T.V. having a screen for conducting the C-scope display of the image data signal from the signal processing device. A control unit when the probe and object are relatively moved by the scanning device, the image data carried by the image data signal from the signal processing device at a corresponding address in the image memory at each pitch which has been determined such that the number of data pickups during the relative movement between the probe and the object coincides with the number of the corresponding addresses in the image memory to thereby cause C-scope display of the image data to be effected on the screen. The is operative to compute, when the cursor is displayed on the screen by the operation device, the amount of operation of the scanning device necessary for locating the probe relative to the object at a position corresponding to the cursor on the screen and operate the scanning device by the thus computed amount to locate the probe at the corresponding position, thereby permitting A-scope display to be effected at such a position on the oscilloscope.