The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 1988

Filed:

Jul. 06, 1987
Applicant:
Inventors:

Stephen C Jacobsen, Salt Lake City, UT (US);

Richard P Phillips, Salt Lake City, UT (US);

John E Wood, Salt Lake City, UT (US);

Assignee:

Sarcos Incorporated, Salt Lake City, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; H04R / ;
U.S. Cl.
CPC ...
318652 ; 307308 ; 324457 ; 357 85 ;
Abstract

Sensor systems and methods for detecting the position and/or movement of an object in multiple degrees of freedom. The sensor system of the present invention comprises at least one field-effect transistor (FET), the geometrical configuration of the FET being selected so as to provide the desired sensitivity. The FET is preferably provided with a conductive gate adjacent to but insulated from the channel region of the FET. An object whose position and/or movement is to be detected is prepared such that an electric field emanates from the object. The FET is brought into the vicinity of the object, and the electric field emanating from the object interacts with the gate and/or channel region of the FET so as to modify the magnitude of the electrical current flowing through the channel region. The current through the channel region is detected and is used to obtain information about the position and movement of the object relative to the channel region of the FET. By positioning a plurality of substantially coplanar FETs in the vicinity of the object, the position and/or movement of the object in any desired number of degrees of freedom can be detected and monitored.


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