The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 1988

Filed:

Apr. 01, 1987
Applicant:
Inventor:

Bao-Shen Liu, Shih Lin District, Taipei, TW;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B43L / ;
U.S. Cl.
CPC ...
33529 ; 33534 ; 33455 ; 33456 ;
Abstract

An angle measuring instrument comprises, a multi-sided plate member which includes a first side and a second side that form an acute angle therebetween when they intersect, a third straight side that forms with the second side an obtuse angle when they intersect, and a graduated semi-circular region. A first measuring arm is pivoted to the plate member at the center of the semi-circular region, a second measuring arm is pivoted to the plate member at a point near the acute angle outside the circular region, and a third measuring arm is pivoted to the first and second measuring arms to form a parallelogram linkage with the plate. The second, and third sides of the plate member serve as measuring sides in cooperation with the measuring arms, thereby diversifying the application of the instrument.


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