The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 1988
Filed:
May. 15, 1987
Gordon J Fergusson, Claremont, CA (US);
Marvin L Vestal, Houston, TX (US);
Vestec Corporation, Houston, TX (US);
Abstract
Improved methods and apparatus are disclosed for detecting negative ions and, more particularly, for detecting negative ions produced from a quadrupole mass spectrometer. By modulating the ion beam either at the ion source or within the ion focusing system, the output current from the electron multiplier detector is a pulsating current which is then capacitively or inductively coupled from a high direct current potential to ground level. Electronics operating at ground level are employed to correct the current signal distortion due to the capacitive or inductive coupling of the detector output current. The present invention enables substantially increased detector sensitivity to negative ions compared to prior art equipment, and does not require expensive and complex preamplifier circuitry. The techniques of the present invention allow both positive and negative ions to be detected utilizing the same basic equipment, thereby increasing equipment versatility and reducing costs.