The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 1988

Filed:

Sep. 11, 1986
Applicant:
Inventors:

Nobutaka Kihara, Kyoto, JP;

Ichiro Asano, Kyoto, JP;

Kennosuke Kojima, Kyoto, JP;

Assignee:

Horiba, Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
2502 / ; 307310 ;
Abstract

A sensitivity calibration circuit for use in an absorption analyzer provided with a check-signal generator for easily checking the sensitivity, includes a temperature compensating circuit for use in an optical system for compensating for a temperature draft due to said optical system and a temperature compensation circuit for use in a sample system for compensating for a temperature draft due to the sample system. The temperature compensation circuit for use in an optical system and the temperature compensation circuit for use in a sample system are separately provided and a switch is provided which is switchable to a measuring state in which both the temperature compensation circuit for use in an optical system and the temperature compensation circuit for use in a sample system are used and is switchable to a checking state in which the temperature compensation circuit for use in a sample system is disconnected so as not to be used but the temperature compensation circuit for use in an optical system is used.


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