The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 1988
Filed:
Apr. 15, 1986
Applicant:
Inventors:
Makoto Hayashi, Hitachi, JP;
Masahiro Otaka, Hitachi, JP;
Tasuku Shimizu, Hitachi, JP;
Shinji Sakata, Kathuta, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382-8 ; 324 64 ; 3241 / ; 358101 ; 358106 ; 358107 ; 364507 ; 382-1 ;
Abstract
The invention scans potential measurement terminals on the surface of a structural member to measure a potential distribution on the surface, detects the direction of a crack from the potential distribution and determining a detailed potential distribution in the direction of the crack thus detected. This potential distribution is compared with master curves of the potential distributions of cracks of various shapes, that have been obtained by analysis in advance, in order to detect the shape of the crack. The present invention can detect accurately a crack shape.