The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 1988

Filed:

Apr. 24, 1987
Applicant:
Inventors:

Semyon Spektor, San Francisco, CA (US);

Michael H Ranger, San Jose, CA (US);

Assignee:

NCR Corporation, Dayton, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01D / ;
U.S. Cl.
CPC ...
346160 ; 346154 ;
Abstract

A system for controlling the intensity of a scanning laser beam used to plot a computer-output microfilm image on an aperture card. The intensity of the beam is controlled by an acousto-optic modulator, which varies the light contained in various components of the modulated output. The first order beam is used for scanning the microfilm because it can be varied from its maximum intensity down to essentially cut-off without requiring large amounts of modulator drive. The intensity control is accomplished in two stages. First, before each scan across the microfilm, a known fraction of the first order beam is split off and sensed for intensity level. This level is directly proportional to the scan beam intensity. The sensed level is then compared to a preset voltage representing the proper exposure operating point for that manufacturer's microfilm characteristics. An error signal is produced by the comparison and is fed into a hold circuit. During this non-microfilm scanning portion of the cycle, the error signal updates the modulator drive level to continuously vary the modulated beam intensity in a way to minimize the error signal, thus, in closed-loop fashion the scan beam intensity is controlled to the proper exposure operating point. Second, as each scan line of the microfilm begins, the hold circuit is switched to 'hold' mode so the intensity level sensed before the scan is the level that is held during the subsequent scan. During the scan, pixel data is modulated to the 'held' intensity level in order to control the modulation of the scan beam intensity to the operating level. By modulating the beam in a purely binary fashion according to pixel data as it scans across the microfilm, a microfilm image is reproduced.


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