The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 1988

Filed:

Apr. 14, 1987
Applicant:
Inventor:

Joseph M Geary, Jupiter, FL (US);

Assignee:

United Technologies Corporation, Hartford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
250560 ; 356361 ;
Abstract

An arrangement for testing a cylindrical object, which may be constituted either by a reflective or refractive element capable of focusing collimated light into a focal line or by an elongated filament, employs cooperation of the element and of the filament, with a laser beam directed onto the element. The filament, especially an optical fiber, extends along the focal line of the element, so that a portion of the laser beam aimed at the element and focused thereby into a waist region extending along the focal line and thus onto the filament, is reflected back to the element and recollimated thereby for travel back along the path of the original laser beam, whereupon the return light beam is caused to interfere with the original laser beam and thus to provide an interferogram that can then be evaluated to obtain information about the magnitude and location of any deviations of the object being tested from its ideal shape.


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