The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 1988
Filed:
Sep. 10, 1986
Applicant:
Inventors:
Yoshimasa Hamano, Kawasaki, JP;
Takashi Masuda, Kawasaki, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; A61B / ;
U.S. Cl.
CPC ...
351211 ; 351212 ; 128660 ;
Abstract
An ophthalmic measuring apparatus has an ultrasonic detector for measuring the length of a predetermined region of an eye to be examined, a device provided with a center axis coaxial with the center axis of the vibrator of the ultrasonic detector and projecting an index mark onto the cornea of the eye to be examined, and an imaging optical system for forming the corneal reflection image of the index mark on a predetermined image plane to measure the shape of the cornea.
Hamano, Yoshimasa. (1988). Ophthalmic measuring apparatus (U.S. Patent No. 4764006). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4764006
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