The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 1988

Filed:

Aug. 17, 1987
Applicant:
Inventors:

Koichi Morita, Osaka, JP;

Susumu Takaichi, Osaka, JP;

Muneyoshi Fujiwara, Osaka, JP;

Makito Seno, Osaka, JP;

Yoshihiko Misawa, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23P / ;
U.S. Cl.
CPC ...
29740 ; 29593 ; 29759 ;
Abstract

In an electronic chip placement machine with test function, there is provided a suction nozzle for holding a chip, a chip-regulation device for regulating the attitude of the chip by clamping the chip at portions having no electrodes probes for testing electrical characteristics of the chip. The tip portion of the suction nozzle is made of an insulating material such as a ceramic or a synthetic resin in order to avoid a short-circuit between electrodes of the chip through the nozzle. Therefore, the electrical characteristics of the chip can be tested without the separation between the nozzle and the chip. Furthermore, since one cycle of the operational process according to the present invention is shorter than that of the conventional operational process, it is possible to provide chip-test and placement machines whose structure is simple. As a result, productivity and durability can also be increased.


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