The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 1988

Filed:

Sep. 23, 1986
Applicant:
Inventors:

Paul K Yeung, Bothell, WA (US);

Alan D Howard, Edmonds, WA (US);

James W Hoo, Seattle, WA (US);

James L Pennock, Seattle, WA (US);

Assignee:

Huntron Instruments, Inc., Lynnwood, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324 / ; 3241 / ; 371 25 ;
Abstract

The apparatus (10) includes a semiconductor tester (12) which in operation produces an analog signature signal relative to a circuit node of an electronic circuit, such as a pin connection of an integrated circuit. The analog signature signal is the result of horizontal and vertical signals which are also directed to an integrator/A-D converter (44) which produces therefrom a set of four digital signals representing said analog signature. These digital signals are then compared in a computer (50) against reference digital values for the same circuit node of the same electronic circuit which is known to be good. If the digital signals are not within a selected range relative to the reference digital values, the analog signature of the circuit node is displayed for inspection and evaluation by an operator.


Find Patent Forward Citations

Yeung, Paul. (1988). Automatic test equipment for integrated circuits (U.S. Patent No. 4763066). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4763066

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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