The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 1988
Filed:
Jun. 16, 1986
Applicant:
Inventors:
Sze-Keung Kwong, Pasadena, CA (US);
George A Rakuljic, Santa Monica, CA (US);
Victor Leyva, Alhambra, CA (US);
Amnon Yariv, San Marino, CA (US);
Assignee:
California Institute of Technology, Pasadena, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ; G02B / ;
U.S. Cl.
CPC ...
350171 ; 350173 ; 350174 ; 350354 ; 350385 ; 350393 ;
Abstract
Real time 'exclusive or' operation, image subtraction, intensity inversion, and first- and second-order differentiation is achieved by an interferometer with a phase conjugate mirror for retroreflection of two or more beams derived from a single beam by a beam splitter and recombined interferometrically by the beam splitter.