The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 1988
Filed:
Oct. 08, 1986
Lennart Svegander, Vaster.ang.s, SE;
Bengt Tornblom, Vaster.ang.s, SE;
Asea AB & Tornbloms Kvalitetskontrollar, Vaster.ang.s, SE;
Abstract
Apparatus for determining the location of surface defects on a test piece of electrically conductive material by scanning the surface with at least one sensor arrangement comprising proximity sensors based on eddy current induction. The test piece may be moveable, e.g. advanced, in relation to the holder arrangement which is arranged to move the sensor arrangement in a sweeping or scanning movement from one side of the test piece to the other. The position of the edge of the test piece, is determined successively, e.g. for each scan cycle and the location of detected cracks is calculated with a starting point from the detected edge position.