The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 1988

Filed:

Nov. 12, 1986
Applicant:
Inventors:

Motoo Ikari, Kyoto, JP;

Yuji Takada, Neyagawa, JP;

Shintaro Yamamoto, Nabari, JP;

Katsuhiro Teramae, Osaka, JP;

Makio Asai, Tatsuno, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01C / ;
U.S. Cl.
CPC ...
250201 ; 356-1 ; 356-4 ;
Abstract

An optical displacement measuring system utilizing a triangulation is so arranged that light receiving means receives light reflected back from an object to be measured and generates a pair of output signals having mutually opposite values and responsive to a position of a light spot on the light receiving means. An operational means performs addition and subtraction over the pair of positional output signals and to obtain a ratio between the both added and subtracted output signals for generating a measured distance signal, and a linearity correcting means provides a mathematical correction number to one of the pair of positional output signals to correct any nonlinearity of the measured distance signal, for providing the linearity to the measured distance signal with a simple arrangement.


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