The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 1988

Filed:

Dec. 08, 1986
Applicant:
Inventors:

Hajime Matsushita, Katsuta, JP;

Ryohei Yabe, Katsuta, JP;

Masaaki Kurimura, Ibaraki, JP;

Toshiaki Yokobayashi, Katsuta, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356 39 ; 356394 ; 356432 ;
Abstract

An automatic cell analyzing system for automatically analyzing a large number of sample slides prepared for cellular samples. The sample slides include a plurality of sample slide sets each prepared by different staining methods for each sample. Cellular images obtained by observing through a microscope the numerous sample slides picked out sequentially are analyzed by an image fetching/feature extracting circuit, the resulting morphological features of the individual cells being converted into digital information to be stored. Upon completion of the analysis for all the sample slides, the digital information obtained from the sample slide is synthetically examined for each associated sample to thereby classify the sample into one of predetermined categories.


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