The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 1988
Filed:
Dec. 30, 1986
Applicant:
Inventors:
Shinichi Katayanagi, Tokyo, JP;
Taro Mori, Tokyo, JP;
Assignee:
Suga Test Instruments Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
738656 ; 374 57 ;
Abstract
An optical deterioration-accelerating weather and optical resistance testing device has a light source and a frame supporting a sample to be tested rotating around the light source. Thermal deterioration of the sample due to radiant heat generated by the light source is inhibited by the provision of a cold air guide enclosing a portion of the sample rotating frame on which the sample is supported. Cold air is introduced to the surfaces of the sample through the cold air guide to maintain the both sides of the sample at a constant test temperature.