The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 1988
Filed:
Dec. 22, 1986
Etsuji Yamamoto, Akishima, JP;
Koichi Sano, Sagamihara, JP;
Hidemi Shiono, Akikawa, JP;
Hideki Kohno, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An NMR imaging method is disclosed in which an object is measured in accordance with a pulse sequence capable of expressing a difference between two of a plurality of chemical shifts by a phase difference in a signal, that is, a pulse sequence 90.degree.-.tau..sub.a -180.degree.-.tau..sub.b -spin echo (where .tau..sub.a .noteq..tau..sub.b) to obtain spin distribution data, a histogram with respect to the phase of the spin distribution data is formed to regard a phase corresponding to that one of a plurality of peaks of the histogram which exists at one end of the histogram, as a position-independent offset phase which is contained in the spin distribution data and is peculiar to an NMR imaging apparatus, and the spin distribution data is corrected using the offset value thus obtained, to extract spin density distribution data for each of the chemical shifts from the corrected spin distribution data.