The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 1988
Filed:
Oct. 28, 1986
Jurgen Gast, Rheinstetten, DE;
Arno Simon, Karlsruhe, DE;
Abstract
In an IR-FR- spectrometer, a light beam (10) is guided from a source to a detector (31) and is passed, in a first mode of operation, by means of first optical means (12, 19, 20) through a sample to be measured (28) and, in a second mode of operation, by second optical means (12, 22, 21) through a reference sample (32). The first and second optical means comprise a common mirror element (12) having at least first and second mirror surfaces (13, 14, 15, 16) which are inclined relative to each other. The mirror surfaces abut in at least one point. There is provided means for moving the mirror element (12) relative to the light beam so that during such relative movement the impinging point of the light beam (10) is displace from the first mirror surface (13), over onto the second mirror surface (14).