The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 1988

Filed:

Aug. 22, 1986
Applicant:
Inventors:

Slava A Pollack, Palos Verdes Estates, CA (US);

I-Fu Shih, Seal Beach, CA (US);

Robert Tzeng, Lomita, CA (US);

Assignee:

Hughes Aircraft Company, Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
250330 ; 250332 ; 25037001 ; 356 731 ;
Abstract

Apparatus is provided for measuring the numerical apertures of an optical fiber in the infrared region. The optical fiber is appropriately mounted in accordance with conventional testing standards. Infrared energy is transmitted through the optical fiber. At a predetermined distance from the end of the optical fiber, a conversion screen can be provided for transforming the emitted infrared energy into a lesser wavelength of energy. The energy distribution can be recorded with a detector compatible with the lesser wavelength energy whereby the numerical aperture can be computed from the recorded data.


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