The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 1988

Filed:

Sep. 29, 1986
Applicant:
Inventor:

Peter V Loeppert, Hoffman Estates, IL (US);

Assignee:

Spectramed, Inc., Newport Beach, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ; G01J / ;
U.S. Cl.
CPC ...
250227 ; 250205 ; 2502 / ;
Abstract

An optoelectronic system for measuring at least one property of an environment includes a first light source for generating light at a first wavelength, first feedback means coupled to the first light source for maintaining the light from the first light source at a substantially constant level, a second light source for generating light at a second wavelength, second feedback means coupled to the second light source for maintaining the light from the second light source at a substantially constant level, a sensor to be placed in an environment, the sensor being responsive to a change in a property of an environment, the sensor generating first and second optical output signals representing a change in the light from the first and second light sources, respectively, due to a property of the environment, an optical waveguide for transmitting light from the first and second light sources to the sensor, a detector for detecting the first and second optical output signals, an optical waveguide for transmitting the first and second optical output signals from the sensor to the detector and apparatus coupled to the detector for determining the value of the property of the environment from the first and second optical output signals.


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