The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 1988
Filed:
Aug. 19, 1985
Applicant:
Inventors:
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
342 25 ; 342196 ;
Abstract
A method of reconstructing original images from synthetic aperture radar image data, wherein in order to speed up the reconstruction of an original image from image data provided by synthetic aperture radar (SAR), the process for generating a point image pattern in correspondence to each point on the original image and the fast Fourier transformation (FFT) process for the generated point image pattern and 1-line image data are carried out once for every certain number of lines. Positional and phase displacement created on a reconstructed image are corrected by multiplying a phase rotation factor to the product of the FFT-processed point image pattern and 1-line image data.