The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 1988
Filed:
Dec. 08, 1986
Toshiaki Ueno, Yokohama, JP;
Fumio Ikeuchi, Yokohama, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A DA converter testing system for testing DA converters which convert digital information into analog information, particularly suitable for testing the dynamic characteristics of such DA converters. The DA converter testing system has an AD conversion means which receives the analog output signal of a test DA converter, operating at a conversion period greater than the waveform repetition period of the repetitive output waveform of the test DA converter. Accordingly, the fast repetitive output waveform of the test DA converter can be converted into corresponding digital codes at a high accuracy and hence the DA converter testing system is more suitable than the conventional DA converter testing system, for testing the dynamic characteristics of DA converters.