The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 1988
Filed:
Nov. 19, 1986
Carl-Zeiss-Stiftung, Heidenheim/Brenz, Oberkochen, DE;
Abstract
In order to initiate the operation of an incremental-correction measurement system, which measures such guidance errors as instantaneous lateral offset of a movable machine part with respect to its guidance direction (Y), a reference mark is provided by two cylindrical lenses (4, 5) which are arranged at an angle to each other and to the guidance direction. Since the distance intercepts for Y-direction scanning of and between the two cylindrical lenses is dependent on the instantaneous lateral offset (.DELTA.X) of the guided part, it is possible to determine the absolute offset values (.DELTA.X.sub.1, .DELTA.X.sub.2) of two spaced incremental-correction measurement systems (K1, K2), using pairs of pulses (A.sub.1/2, B.sub.1/2) generated by two signal transmitters (KNIP1, KNIP2) upon their scanning traverse of the respective cylindrical lenses in the course of a single calibration run.