The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 1988

Filed:

Feb. 17, 1987
Applicant:
Inventors:

Hirohide Miwa, Kawasaki, JP;

Keiichi Murakami, Kawasaki, JP;

Takaki Shimura, Machida, JP;

Yutaka Igarashi, Yokohama, JP;

Akira Shiba, Kawasaki, JP;

Hajime Hayashi, Yamato, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73602 ; 73599 ; 128660 ;
Abstract

The present invention relates to a signal processing apparatus for quantitatively measuring ultrasonic characteristics of a medium, such as a human body and realizes the high speed quantitative measurement by processing all signals in the time domain. In the processing for eliminating an error, produced by a degree of convergence of the ultrasonic beam, a correcting function that is a function of the depth and frequency is employed. The correcting function is measured in a no-attenuation medium and converted into a form suited to the time domain processing. The function is stored and such frequency characteristics of the function are sequentially read during an actual medium measurement to control the characteristic of a variable characteristic filter to correct the received signal.


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