The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 1988
Filed:
Sep. 22, 1986
Friedhelm Korte, Attenkirchen, DE;
Ahmet H Parlar, Attenkirchen, DE;
Frederick Coulston, Alamogordo, NM (US);
Coulston International Corporation, Albany, NY (US);
Abstract
A single-stage quadrupole mass analyzer is provided with a highly sensitive electron multiplier, a turbomolecular pump, and a mass correction lens placed between the quadrupole sensor unit and the turbomolecular pump. These components are arranged and selected to provide a substantial increase in sensitivity permitting the direct analysis of organic compounds in the gas phase in the ppb and high ppt concentration range. The placement of the mass correction lens and the area of its aperture has a pronounced effect on the detection limit, the optimum aperture area is a function of the mass of the molecules to be detected, and preferably an iris diaphragm is used to permit manual of automatic adjustment of the aperture area to a predetermined optimum for each of the different substances to be detected. Preferably the electron multiplier voltage is also variably selected and reset during the scanning of each fragment ion to optimize the signal-to-noise ratio of the electron mutiplier. The mass analyzer is sufficiently compact and economical to provide on-site analysis and the continuous monitoring or control of industrial processes.