The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 1988

Filed:

May. 05, 1986
Applicant:
Inventors:

Ken Yonekubo, Hachiouji, JP;

Yasuo Inoue, Hachiouji, JP;

Itaru Endo, Hachiouji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
350509 ; 350510 ; 350520 ; 350521 ; 350526 ; 350527 ;
Abstract

A multiple-purpose microscope comprising: a stage for placing a specimen; a revolver for carrying a plurality of objective lenses; a differential interference unit mounted adjacent to the revolver so as to be moved into and out of a path of light beam; and two dichroic mirror units for reflecting fluorescence mounted so as to be moved into and out of the path of a light beam, whereby enabling its user to perform various different types of microscope examinations by a simplified examination mode changeover operation. The dichroic mirror unit for reflecting fluorescence is comprised of a dichroic mirror, an exciting filter and a barrier filter.


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