The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 1988
Filed:
Jul. 21, 1986
Applicant:
Inventors:
Yutaka Kaneko, Kanagawa, JP;
Nobuo Sakuma, Tokyo, JP;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
350-68 ; 350433 ; 350434 ; 350571 ;
Abstract
An optical beam scanning system which is employed as an optical scanning means for writing or reading information with a laser beam includes a lens disposed in front of a light deflector with respect to the path of travel of the laser beam. The lens has an optical axis normal to the axis of rotation or angular movement of the light deflector. The lens is arranged such that the laser beam will be applied thereto parallel to the optial axis thereof and at a suitable lens height thereon. The laser beam that has reached the light deflector through the lens is reflected as a scanning light beam as the light deflector rotates or is angularly moved.