The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 1988
Filed:
Nov. 24, 1986
David L Melton, Fort Wayne, IN (US);
Keith E Caudill, Fort Wayne, IN (US);
ITT Aerospace Optical a division of ITT Corporation, Fort Wayne, IN (US);
Abstract
Apparatus for measuring the modulus of elasticity of a sample specimen of a given thickness and area includes means for mounting one surface of the specimen on a rigid reference plane and an opposing surface of the specimen is then mounted on a rotatable surface. A torque arm coupled to the rotatable surface applies a predetermined torque which effectively causes this surface to rotate thereby twisting the specimen through a given angle. The angle is measured by means coupled to the rotatable surface, and based on the measured angle, one can calculate the modulus of elasticity in regard to the measured angle and in regard to the applied torque. The apparatus and methods essentially measure the modulus of elasticity through angular displacement of the specimen. The method and apparatus is particularly adaptable to measure the modulus of elasticity of a compliant layer associated with a printed circuit board which compliant layer acts as a stress relief layer for surface mounted components and solder joints coupling those components to the printed circuit board assembly.