The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 1988
Filed:
Oct. 01, 1986
Applicant:
Inventors:
John E Syka, Sunnyvale, CA (US);
William J Fies, Jr, Portola Valley, CA (US);
Assignee:
Finnigan Corporation, San Jose, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250292 ; 250291 ; 250282 ;
Abstract
A quadrupole mass spectrometer in which a sample to be analyzed is ionized in a two or three dimensional electrostatic trapping field, and the ions in the range of the mass-to-charge ratios to be analyzed are excited at their characteristic frequencies of motion. The excited ions generate image currents which are detected and processed to provide a mass spectrum.