The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 1988
Filed:
Jun. 05, 1986
Applicant:
Inventors:
Marzio Giglio, Milan, IT;
Umberto Perrini, Lodi, IT;
Assignee:
Fritsch GmbH, Idar-Oberstein, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356336 ; 356343 ;
Abstract
An apparatus for determining grain size distribution patterns of particles for selected measuring ranges, wherein a specimen cell (15) is arranged in a convergent monochromatic light beam (4) and the produced diffraction patterns (5a, 6a, 7a) are received by a photo detector. By altering the spacing of the specimen cell (15) from the photo detector (44), the measuring range can be selected for differing grain sizes.