The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 1988

Filed:

Mar. 14, 1986
Applicant:
Inventor:

Issei Mori, Tochigi, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
378 19 ; 378-4 ; 378 10 ;
Abstract

An X-ray CT system includes an X-ray source, a drive device, an X-ray detector, a data acquisition system, a reconstruction processor and a delay circuit. The X-ray source emits an X-ray fan beam onto an object and is rotated by the drive device on substantially the same plane as the fan beam. A graticule sensor detects an angular position of the X-ray source. The X-ray detector consists of detector elements fixed concentrically with a relative rotational path of the X-ray source. The data acquisition system responds to a position signal from the graticule sensor and samples the output data from the detector for each predetermined angular position of the X-ray source to obtain projection data. The projection data is reconstructed by the reconstruction processor to obtain a tomographic image of the object. The delay circuit delays the position signal from the graticule sensor to offset the sampling point of the projection data by a 1/4 sampling point pitch from the angle corresponding to the center of each detection element.


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