The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 1988

Filed:

Oct. 20, 1986
Applicant:
Inventors:

Josephus J In Den Kleef, Eindhoven, NL;

Johannes P Groen, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324309 ; 324312 ;
Abstract

During known MRI measurements, for example spin echo and inversion recovery measurements, phase errors occur in pixels, inter alia due to eddy currents caused by the application or interruption of magnetic field gradients during a measurement. There is proposed an inversion recovery method combined with a method where the magnetization is not inverted in advance in order to determine for each pixel the phase error in an image obtained by means of an inversion recovery method, so that inversion recovery images can be obtained which do not contain phase errors.


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