The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 1988
Filed:
Dec. 29, 1986
Applicant:
Inventors:
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324309 ; 324312 ;
Abstract
Method for measuring the time dependence of an oscillating field gradient and representatively its integral function with respect to time for imaging method using the field gradient such as rapid chemical shift imaging method echo planar method, etc. A uniform specimen is placed within a coil of an NMR device, in which nuclear spins are excited; a phase encoding field gradient is applied thereto; and signals are sampled under application of the field gradient to be measured. These steps are repeated and an integral function of the field gradient with respect to time is obtained by using the peak position in the series of data obtained by this repetition.