The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 1988
Filed:
Oct. 01, 1986
Paolo Cielo, Montreal, CA;
Gerard Rousset, Montreal, CA;
Abstract
A method for the detection of delaminated areas in coated materials or layered composites, which allows free-air operation and can be used to scan portions of bulky materials on the spot. This method which makes it possible to detect very small delaminated areas in a very short time (less than 1 millisecond), with a very high sensitivity and without creation of excessive thermal stress in the inspected material, basically comprises the steps of: focusing pulsed, thermal radiations onto the structure to be inspected to produce a vertical displacement of its coating by thermal expansion if a delaminated area is present at the coating-to-substrate interface, and detecting and measuring this vertical displacement if any, by interferometry, preferably laser-beam interferometry. An apparatus for carrying out this method is also disclosed.