The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 1988

Filed:

Oct. 28, 1985
Applicant:
Inventor:

Matti Lyyra, Vantaa, FI;

Assignee:

Vaisala Oy, , FI;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ; G08C / ;
U.S. Cl.
CPC ...
364482 ; 324 / ; 34087001 ; 34087004 ; 364571 ;
Abstract

A method of and arrangement for measuring impedances, particularly low capacitances, by alternately connecting one or more reference impedances and sensor impedances to a measuring circuit. A programmed memory is used to take into account the individual non-linearities of the impedance sensor(s) and, optionally, to compensate variations of ambient circumstances such as temperature.


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Lyyra, Matti. (1988). Method of and arrangement for measuring impedances in measuring circuits (U.S. Patent No. 4751654). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4751654

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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