The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 1988
Filed:
Oct. 28, 1985
Narasimharao Koka, Richmond Hts., OH (US);
Heang K Tuy, Cleveland, OH (US);
Gordon D DeMeester, Wickliffe, OH (US);
Rodney A Mattson, Mentor, OH (US);
Picker International, Inc., Highland Hts., OH (US);
Abstract
In a fourth generation CT scanner, source views or data sets are generated for reconstruction processing. A fan beam (16) of radiation rays is rotated around an image region (12) to irradiate subsets of detectors of a detector ring (10). A data sampler (B) samples the detectors of each irradiated subset a plurality of times, each time with the radiation fan beam displaced incremently from the preceding time to generate a plurality of the source views or data sheets from the same detectors. A plurality of consecutive source views or data sets are interleaved to produce a signal interleaved view or data fan. More specifically, the data sets are stored in data set memories (20-26) and interleaved serially into a data fan memory (30). Each time the fan beam rotates sufficiently to irradiate a different detector subset, an additional plurality of data sets are generated and interleaved into another data fan. The data fans are reconstructed (E) into a representation of an image of radiation absorptive properties of an object disposed in the image region. This reconstruction method is especially applicable to cardiac synchronization or gated patient scanning. This method improves the dynamic scan capacity of fourth generation scanners, improves tolerance to detector drifts, and improves tolerance to temporal x-ray fluctuations.