The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 1988
Filed:
Dec. 29, 1986
Hideo Ishizaka, Kanagawa, JP;
Yuji Ohara, Kanagawa, JP;
Fuji Photo Film Co., Ltd., , JP;
Abstract
In a light beam scanning recording apparatus, a light beam is modulated by a modulator according to image signals and is caused to scan a photosensitive recording material, and the recording material is developed. The apparatus is provided with a signal converting section which converts image signals to be input into the modulator according to a predetermined conversion table so that desired image densities can be obtained on the recording material, a test pattern signal generating section which generates test pattern signals bearing thereon different image densities and inputs them into the modulator, an image density measuring system which measures the image densities of the test pattern on the recording material developed after scanning by a light beam modulated according to the test pattern signals, and a conversion table making section which determines, on the basis of the relation between the test pattern signals and the image densities of the test pattern measured by the image density measuring system and desired image signal-image density characteristics, the image signals corresponding to the image densities obtained by the respective test pattern signals referring to the desired image signal-image density characteristics, thereby obtaining the relation between the image signals and the test pattern signals, and makes the conversion table on the basis of the relation between the image signals and the test pattern signal.