The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 1988
Filed:
Aug. 12, 1986
James H Fisher, Wheaton, IL (US);
Philip Jacoby, Naperville, IL (US);
Amoco Corporation, Chicago, IL (US);
Abstract
A method and device are disclosed for the determination of the environmental stress crack resistance (ESCR) of polymer articles made from polymers such as acrylonitrile-butadiene-styrene copolymers, polycarbonate, polystyrene and blends thereof. The method and device involve the external application of stress to an unstressed test article which has been exposed to a stress cracking agent. The stress is induced by means of a weight located below the horizontal plane of the plastic article. The time between the application of stress and the cracking of the test article is measured to compute a characteristic ESCR parameter and thereby evaluate the environmental stress crack resistance of the article.