The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 1988
Filed:
Aug. 06, 1986
Hitoshi Sakisako, Tokyo, JP;
Masashi Kimura, Tokyo, JP;
Ebara Densan Ltd., , JP;
Abstract
Automatic titration analysis apparatus includes a sampling mechanism, a titration mechanism, an analysis mechanism and a control mechanism. The sampling mechanism takes a prescribed quantity of a sample for analysis in accordance with a first signal. The titration mechanism titrates a prescribed quantity of a reagent for analysis of the sample and provides a titer at an end point of the titration according to second signals. The analysis mechanism receives the sample from the sampling mechanism, analyzes the sample and converts a change in the physical properties of the sample caused by the titration into an electrical quantity. The control mechanism provides and applies the first signal to the sampling mechanism, provides and applies the second signals to the titration mechanism, receives the titer from the titration mechanism, receives the electrical quantity from the analysis mechanism, sets the quantity of the sample converted and the titer of the reagent to prescribed values, reads the titer at the end point of the titration, outputs the measured density of the sample calculated therefrom, and controls in sequence the operations of the sampling, titration and analysis mechanisms.