The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 1988
Filed:
Dec. 09, 1985
Jens Frahm, Goettingen, DE;
Axel Haase, Goettingen, DE;
Wolfgang Haenicke, Goettingen, DE;
Klaus-Dietmar Merboldt, Goettingen, DE;
Dieter Matthaei, Goettingen, DE;
Max-Planck-Gesellschaft zur Foerderung der Wissenschaften E.V., Goettingen, DE;
Abstract
A method and an apparatus for a locally resolved investigation of a speci, wherein the specimen is exposed to a constant magnetic field and a variable combination of three gradient magnetic fields directed substantially perpendicularly to each other and to a sequence of high-frequency (RF) pulses which contains three successive pulses with flip angles not equal to .vertline.m Pi.vertline., and signals corresponding to a magnetic resonance of spin moments, in particular nuclear spin moments in said specimen are detected. The interval (tau) between the first and the second pulse is greater than T.sub.2eff and smaller than 5T.sub.2, and that the interval (T-tau) between the second and the third pulse is greater than T.sub.2eff and smaller than 5T.sub.1, wherein