The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 1988
Filed:
Apr. 08, 1987
Applicant:
Inventors:
Akira Kobayashi, Kanagawa, JP;
Tomio Yamaura, Tokyo, JP;
Mizuo Nakayama, Tokyo, JP;
Hisao Itaya, Aono, JP;
Assignee:
Gunze Limited, Kyoto, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250563 ; 250572 ; 356431 ;
Abstract
A proposal for detecting flaws not defining normal stitches in a knitted fabric. Fabric detection signals are derived from three detectors arranged to correspond to intervals between lines of thread defining stitches. The detection signals are then added with predetermined weights, and the signals thus weighted are subjected to adding and/or subtracting operations. As a result, the flaws not defining normal stitches in the knitted fabric are detected. According to this proposal, reliable detection is made of not only large flaws such as circular holes but narrow flaws such as runs also.