The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 1988
Filed:
Dec. 22, 1986
Frank S Krufka, Mount Joy, PA (US);
RCA Licensing Corporation, Princeton, NJ (US);
Abstract
A method for measuring spaces in a periodic matrix having a period including a plurality of spaces and areas therebetween includes placing the matrix between a light source and an array of pixels for receiving the light shadow image for the matrix. A plurality of image lines from the matrix are scanned across the array and signals are produced representative of the spaces and areas therebetween, which signals are converted into data values and transmitted to means for storing the data values for each of the scan lines as a row and for successive scan lines as columns. Selected data values in predetermined groups of columns, representing corresponding nonadjacent spaces of the periodic matrix, are added to obtain a total for each group. The total for each group is divided by the number of selected data values in that group. The average data value for each group is multiplied by a linear value representing the average length of each pixel to obtain the average space length for each group.